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Introduction of Constraint-Based Test-Data Generation in DCRTT

Date: 29 Oct 2010

In addition to the well-established heuristic and statistic test-data generation approaches, BSSE is currently implementing constraint-based test-data generation for its sophisticated automatic test tool for C, DCRTT.

The new technology will allow to not only determine the properties of a system-under-test under statistically relevant conditions, but also to reach complete or near-to-complete test-coverage without manual intervention.